Title :
Fast-Yet-Accurate Statistical Soft-Error-Rate Analysis Considering Full-Spectrum Charge Collection
Author :
Hsuan-Ming Huang ; Wen, C.H.-P.
Author_Institution :
Dept. of the Electr. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
Soft errors are a growing concern in highly scaled CMOS technologies; estimating error rates for a given design remains very challenging. This article presents a fast statistical soft-error-rate analysis approach that is nearly as accurate as computationally complex Monte Carlo SPICE simulation.
Keywords :
CMOS integrated circuits; Monte Carlo methods; SPICE; integrated circuit design; radiation hardening (electronics); statistical analysis; CMOS technology; Monte Carlo SPICE simulation; full-spectrum charge collection; statistical soft-error-rate analysis; Circuit faults; Computational modeling; Error analylsis; Integrated circuit modeling; Logic gates; Monte Carlo methods; Support vector machines; Transient analysis; Monte Carlo; SVM; process variation; soft error;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDT.2012.2194471
