• DocumentCode
    892323
  • Title

    Measured Noise Temperature Versus Theoretical Electron Temperature for Gas Discharge Noise Sources

  • Author

    Olson, Keith W.

  • Volume
    16
  • Issue
    9
  • fYear
    1968
  • fDate
    9/1/1968 12:00:00 AM
  • Firstpage
    640
  • Lastpage
    645
  • Abstract
    In the past, measured noise temperatures Tn of a few commercially available gas discharge noise sources were indicated as agreeing with the predicted electron temperature Te of the positive column based on the von Engel and Steenbeck relationship. Data were taken over the past 2 years on argon tubes over a pressure range of 5 to 40 mm and on neon tubes at 20 mm, with current variations from 100 to 300 mAdc. These data were compared against predicted electron temperatures. For the argon tubes at pressure-radius products greater than 20 mm˙cm there appeared to be reasonable correlation between the measured noise temperature and the predicted electron temperature although it is suggested that this correlation was fortuitous. For argon pressure-radius products less than 20 mm˙cm the measured noise temperature was as much as 15 percent lower than the predicted electron temperature. For neon tubes at 20-mm pressure, with the same variation in tube radius, and for pressure-radius products less than 24.0 mm˙cm, the measured noise temperature differed even more than for argon from the predicted electron temperature. A difference of as much as 30 percent at a pressure-radius product of 3.0 mm˙cm was observed. A qualitative explanation for argon is presented based mainly on the fact that these discharges do not have a Maxwellian distribution of electron velocities nor a velocity independent electron collision frequency. For neon the wide variation was not understood.
  • Keywords
    Argon; Current measurement; Discharges; Electron tubes; Insertion loss; Microwave measurements; NIST; Noise measurement; Signal to noise ratio; Temperature measurement;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1968.1126766
  • Filename
    1126766