DocumentCode :
892324
Title :
Transient behavior of high-field domains in bulk semiconductors
Author :
Kurokawa, Kaneyuki
Volume :
55
Issue :
9
fYear :
1967
Firstpage :
1615
Lastpage :
1616
Abstract :
A simple formula giving the growth rate of high-field domains in bulk semiconductors is derived. When the diffusion constant is small, it reduces to an extension of the equal-area law discussed by Butcher et al.
Keywords :
Anodes; Cathodes; Conducting materials; Conductors; Current density; Dielectric constant; Electron mobility; Poisson equations; Transient analysis; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1967.5913
Filename :
1447843
Link To Document :
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