DocumentCode
892597
Title
Exponential-type error probabilities for multiterminal hypothesis testing
Author
Han, Te Sun ; Kobayashi, Kingo
Author_Institution
Dept. of Inf. Syst., Senshu Univ., Kawasaki, Japan
Volume
35
Issue
1
fYear
1989
fDate
1/1/1989 12:00:00 AM
Firstpage
2
Lastpage
14
Abstract
Multiterminal hypothesis testing is considered, subject to the exponential-type constraint αn⩽exp(-nr ) on the error probability of the first kind. The problem is to determine the minimum β*n of the error probability of the second kind under the given constraint at limited rates R 1 and R 2 for observing the respective pairs of variables. Good lower bounds on the power exponent for β*n are presented by invoking basic properties of r -divergent sequences. In particular, the one-bit and the zero-rate compression cases are considered. The power exponent for the former and a lower bound for the latter are established
Keywords
error statistics; information theory; probability; error probability; exponential-type constraint; information theory; lower bounds; multiterminal hypothesis testing; one-bit compression; power exponent; r-divergent sequences; zero-rate compression; Decoding; Error probability; Information systems; Information theory; Mathematics; Performance evaluation; Statistical analysis; System testing;
fLanguage
English
Journal_Title
Information Theory, IEEE Transactions on
Publisher
ieee
ISSN
0018-9448
Type
jour
DOI
10.1109/18.42171
Filename
42171
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