DocumentCode :
892786
Title :
CCD sampling of high-frequency broad-band signals
Author :
Gradl, David A.
Volume :
17
Issue :
3
fYear :
1982
fDate :
6/1/1982 12:00:00 AM
Firstpage :
619
Lastpage :
626
Abstract :
Several CCD signal sampling methods are discussed and a CCD input technique with excellent high-speed sampler characteristics is described. The method, a version of the diode-cutoff technique, is being used in a 200 MHz/8 bit transient digitizer system currently under development. DC based signal bandwidth (3 dB) of 600 to 800 MHz has been achieved along with random aperture uncertainty dispersion (one-sigma) of less than 2 ps. The sampler structure, operation, and experimental test results are described.
Keywords :
Charge-coupled device circuits; Signal processing; charge-coupled device circuits; signal processing; Bandwidth; Charge coupled devices; Circuits; Constraint theory; Large scale integration; Microprocessors; Sampling methods; Signal design; Signal sampling; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1982.1051787
Filename :
1051787
Link To Document :
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