DocumentCode :
892790
Title :
Software Reliability Growth Models with Testing-Effort
Author :
Yamada, Shigeru ; Ohtera, Hiroshi ; Narihisa, Hiroyuki
Author_Institution :
Okayama University of Science, Okayama
Volume :
35
Issue :
1
fYear :
1986
fDate :
4/1/1986 12:00:00 AM
Firstpage :
19
Lastpage :
23
Abstract :
Many software reliability growth models have been proposed in the past decade. Those models tacitly assume that testing-effort expenditures are constant throughout software testing. This paper develops realistic software reliability growth models incorporating the effect of testing-effort. The software error detection phenomenon in software testing is modeled by a nonhomogeneous Poisson process. The software reliability assessment measures and the estimation methods of parameters are investigated. Testing-effort expenditures are described by exponential and Rayleigh curves. Least-squares estimators and maximum likelihood estimators are used for the reliability growth parameters. The software reliability data analyses use actual data. The software reliability growth models with testing-effort can consider the relationship between the software reliability growth and the effect of testing-effort. Thus, the proposed models will enable us to evaluate software reliability more realistically.
Keywords :
Data analysis; Maximum likelihood detection; Maximum likelihood estimation; Parameter estimation; Probability; Software measurement; Software reliability; Software systems; Software testing; Statistical analysis;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1986.4335332
Filename :
4335332
Link To Document :
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