• DocumentCode
    892790
  • Title

    Software Reliability Growth Models with Testing-Effort

  • Author

    Yamada, Shigeru ; Ohtera, Hiroshi ; Narihisa, Hiroyuki

  • Author_Institution
    Okayama University of Science, Okayama
  • Volume
    35
  • Issue
    1
  • fYear
    1986
  • fDate
    4/1/1986 12:00:00 AM
  • Firstpage
    19
  • Lastpage
    23
  • Abstract
    Many software reliability growth models have been proposed in the past decade. Those models tacitly assume that testing-effort expenditures are constant throughout software testing. This paper develops realistic software reliability growth models incorporating the effect of testing-effort. The software error detection phenomenon in software testing is modeled by a nonhomogeneous Poisson process. The software reliability assessment measures and the estimation methods of parameters are investigated. Testing-effort expenditures are described by exponential and Rayleigh curves. Least-squares estimators and maximum likelihood estimators are used for the reliability growth parameters. The software reliability data analyses use actual data. The software reliability growth models with testing-effort can consider the relationship between the software reliability growth and the effect of testing-effort. Thus, the proposed models will enable us to evaluate software reliability more realistically.
  • Keywords
    Data analysis; Maximum likelihood detection; Maximum likelihood estimation; Parameter estimation; Probability; Software measurement; Software reliability; Software systems; Software testing; Statistical analysis;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1986.4335332
  • Filename
    4335332