Title :
Dependence of the resistivity of chromium-silicon monoxide films on their chemical composition
Abstract :
It was assumed that a chromium-silicon monoxide film is composed of metal grains dispersed within a dielectric matrix. Therefore its electrical behavior was iterpreted according to the hypothesis that the charge transport takes place by tunnelig through the potential barriers between conducting islands.
Keywords :
Chemicals; Circuit stability; Conductivity; Distributed control; Educational institutions; Frequency; Polynomials; Signal analysis; Speech analysis; System testing;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1967.6002
