DocumentCode
893202
Title
Dependence of the resistivity of chromium-silicon monoxide films on their chemical composition
Author
Reale, C.
Volume
55
Issue
10
fYear
1967
Firstpage
1770
Lastpage
1771
Abstract
It was assumed that a chromium-silicon monoxide film is composed of metal grains dispersed within a dielectric matrix. Therefore its electrical behavior was iterpreted according to the hypothesis that the charge transport takes place by tunnelig through the potential barriers between conducting islands.
Keywords
Chemicals; Circuit stability; Conductivity; Distributed control; Educational institutions; Frequency; Polynomials; Signal analysis; Speech analysis; System testing;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1967.6002
Filename
1447932
Link To Document