DocumentCode :
893204
Title :
SNOS 1Kx8 static nonvolatile RAM
Author :
Donaldson, Darrel D. ; Eby, Michael D. ; Fahrenbruck, Roy ; Honnigford, Edward H.
Volume :
17
Issue :
5
fYear :
1982
Firstpage :
847
Lastpage :
851
Abstract :
Using an advanced n-channel, double level polysilicon SNOS technology, a 1K/spl times/8 bit nonvolatile static RAM has been designed. Typical RAM access time is 300 ns, with typical active power dissipation of 300 mW, and standby power of 160 mW. Endurance of 10/SUP 4/ erase/store cycles has been demonstrated. The ability to measure erased and written memory thresholds allows prediction of retention lifetime. For the 8K NVRAM, the minimum retention lifetime is 1 year following a 10 ms erase and store.
Keywords :
Field effect integrated circuits; field effect integrated circuits; Capacitors; EPROM; Manufacturing; Nonvolatile memory; Random access memory; Read-write memory; Resistors; Silicon; Temperature distribution; Testing;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1982.1051829
Filename :
1051829
Link To Document :
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