• DocumentCode
    894069
  • Title

    Compact DC model of GaAs FETs for large-signal computer calculation

  • Author

    Kacprzak, Tomasz ; Materka, Andrzej

  • Volume
    18
  • Issue
    2
  • fYear
    1983
  • fDate
    4/1/1983 12:00:00 AM
  • Firstpage
    211
  • Lastpage
    213
  • Abstract
    A modified, simple and fairly accurate explicit expression of DC current-voltage characteristics of GaAs FETs is presented. A departure from the square-law behavior in saturation of the short channel transistor is included by introducing drain-source voltage bias dependent pinch-off potential. The model proposed here needs four parameters extracted by the global curve-fitting technique of a measured family of drain current-voltage characteristics. A comparison with other DC compact models of MESFETs valid over the entire range of drain-source voltages shows good compromise between simplicity and accuracy of the model proposed. The model can be easily implemented in programs of computer-aided analysis and design of circuits with GaAs FETs.
  • Keywords
    Circuit CAD; Gallium arsenide; III-V semiconductors; Schottky gate field effect transistors; Semiconductor device models; circuit CAD; gallium arsenide; semiconductor device models; Current measurement; Current-voltage characteristics; Electrons; FETs; Gallium arsenide; Gunn devices; Integrated circuit modeling; MESFETs; Substrates; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1983.1051924
  • Filename
    1051924