Title :
Compact DC model of GaAs FETs for large-signal computer calculation
Author :
Kacprzak, Tomasz ; Materka, Andrzej
fDate :
4/1/1983 12:00:00 AM
Abstract :
A modified, simple and fairly accurate explicit expression of DC current-voltage characteristics of GaAs FETs is presented. A departure from the square-law behavior in saturation of the short channel transistor is included by introducing drain-source voltage bias dependent pinch-off potential. The model proposed here needs four parameters extracted by the global curve-fitting technique of a measured family of drain current-voltage characteristics. A comparison with other DC compact models of MESFETs valid over the entire range of drain-source voltages shows good compromise between simplicity and accuracy of the model proposed. The model can be easily implemented in programs of computer-aided analysis and design of circuits with GaAs FETs.
Keywords :
Circuit CAD; Gallium arsenide; III-V semiconductors; Schottky gate field effect transistors; Semiconductor device models; circuit CAD; gallium arsenide; semiconductor device models; Current measurement; Current-voltage characteristics; Electrons; FETs; Gallium arsenide; Gunn devices; Integrated circuit modeling; MESFETs; Substrates; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1983.1051924