A frequency reference photonic integrated circuit for WDM with low polarization dependence

Author

Verdiell, J.-M. ; Newkirk, M.A. ; Koch, T.L. ; Gnall, R.P. ; Koren, U. ; Miller, B.I. ; Tell, B.

Author_Institution

AT&T Bell Lab., Holmdel, NJ, USA

Volume

5

Issue

4

fYear

1993

fDate

4/1/1993 12:00:00 AM

Firstpage

451

Lastpage

454

Abstract

A photonic circuit implementing ten frequency reference filters for narrow-channel wavelength division multiplexing (WDM) has been fabricated. A diluted multiquantum-well waveguide structure is shown to yield a very low TE/TM polarization dependence of 1 AA, as well as improved absolute frequency control and reproducibility. A standard deviation in absolute filter wavelength of 3.33 AA is measured on a random set of devices from a 2-in wafer. The ten channels are evenly spaced by 7.2 AA. Such filters can be used to lock tunable lasers to a set of reference frequencies for WDM applications. The demonstrated diluted multiquantum-well waveguide structure with low birefringence and improved absolute wavelength control could potentially be used in other WDM integrated circuits requiring tight wavelength tolerance and polarization insensitivity.<>

Keywords

integrated optics; optical communication equipment; optical filters; semiconductor quantum wells; wavelength division multiplexing; TE/TM polarization; WDM; absolute frequency control; absolute wavelength control; diluted multiquantum-well waveguide structure; frequency reference filters; frequency reference photonic integrated circuit; frequency reproducibility; low birefringence; low polarization dependence; narrow-channel wavelength division multiplexing; polarization insensitivity; tight wavelength tolerance; tunable laser locking; Filters; Frequency control; Integrated circuit yield; Measurement standards; Photonic integrated circuits; Polarization; Reproducibility of results; Tellurium; Wavelength division multiplexing; Wavelength measurement;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/68.212696

Filename

212696