DocumentCode
894372
Title
Comparison of the neutron radiation tolerance of bipolar and junction field effect transistors
Author
Buchanan, B. ; Dolan, R. ; Roosild, S.
Volume
55
Issue
12
fYear
1967
Firstpage
2188
Lastpage
2189
Abstract
The radiation tolerance is defined to be the integrated neutron flux required to reduce the transconductance or common emitter current gain by a tolerable reduction factor. Using this definition, simplified gain models, and empirical data, general expressions are derived and comparisons made which indicate that the junction field effect transistor is inherently more radiation tolerant than the bipolar.
Keywords
Bipolar transistors; Charge carrier lifetime; Doping; Equations; FETs; Gain measurement; Genetic expression; Integrated circuit measurements; Neutrons; Silicon;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1967.6119
Filename
1448049
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