• DocumentCode
    894372
  • Title

    Comparison of the neutron radiation tolerance of bipolar and junction field effect transistors

  • Author

    Buchanan, B. ; Dolan, R. ; Roosild, S.

  • Volume
    55
  • Issue
    12
  • fYear
    1967
  • Firstpage
    2188
  • Lastpage
    2189
  • Abstract
    The radiation tolerance is defined to be the integrated neutron flux required to reduce the transconductance or common emitter current gain by a tolerable reduction factor. Using this definition, simplified gain models, and empirical data, general expressions are derived and comparisons made which indicate that the junction field effect transistor is inherently more radiation tolerant than the bipolar.
  • Keywords
    Bipolar transistors; Charge carrier lifetime; Doping; Equations; FETs; Gain measurement; Genetic expression; Integrated circuit measurements; Neutrons; Silicon;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1967.6119
  • Filename
    1448049