• DocumentCode
    894515
  • Title

    Foreword (October 1983)

  • Volume
    18
  • Issue
    5
  • fYear
    1983
  • Firstpage
    435
  • Lastpage
    436
  • Keywords
    Delay; Integrated circuit technology; Laboratories; Logic; MOS devices; Power dissipation; Random access memory; Read-write memory; Refining; Solid state circuits;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1983.1051973
  • Filename
    1051973