DocumentCode
894515
Title
Foreword (October 1983)
Volume
18
Issue
5
fYear
1983
Firstpage
435
Lastpage
436
Keywords
Delay; Integrated circuit technology; Laboratories; Logic; MOS devices; Power dissipation; Random access memory; Read-write memory; Refining; Solid state circuits;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1983.1051973
Filename
1051973
Link To Document