• DocumentCode
    894637
  • Title

    Availability of systems with partially observable failures

  • Author

    Ibe, Oliver C. ; Wein, Anne S.

  • Author_Institution
    GTE Labs. Inc., Waltham, MA, USA
  • Volume
    41
  • Issue
    1
  • fYear
    1992
  • fDate
    3/1/1992 12:00:00 AM
  • Firstpage
    92
  • Lastpage
    96
  • Abstract
    The availability is determined for the following kind of system. When the system is operational (up), it can fail in either one of two modes. However, the system operator does not always diagnose the failure mode correctly. Given that one failure mode has occurred, the authors correctly diagnose the failure mode with a given probability η and misdiagnose it with probability 1-η, where η may vary with failure mode. The problem is modeled by a partially observable Markov process. Numerical results indicate that a high probability of misdiagnosis produces appreciably high system-downtime
  • Keywords
    Markov processes; failure analysis; probability; reliability theory; Markov process; failure mode; misdiagnosis; partially observable failures; probability; reliability; system-downtime; Availability; Costs; Diodes; Failure analysis; Identity-based encryption; Laboratories; Markov processes; Steady-state; Stochastic processes; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.126678
  • Filename
    126678