Title :
A 16 kbit smart 5 V-only EEPROM with redundancy
Author :
Lucero, Elroy M. ; Challa, Nagesh ; Fields, Julian, Jr.
Abstract :
This paper describes several circuit techniques used in the design of a 5-V-only 16 Kbit EEPROM. The EEPROM uses a two transistor cell based on Fowler-Nordheim tunneling to a floating polysilicon gate. The EEPROM features 5-V-only operation, a self-timed program cycle with automatic erase before write, address and data latches, and a `ready´ line output. These features make the program cycle timing compatible with static RAMs and simplifies the microprocessor interface. A new redundancy technique using EE cells as the programming element is also described.
Keywords :
Field effect integrated circuits; Integrated circuit technology; Integrated memory circuits; Large scale integration; PROM; Redundancy; field effect integrated circuits; integrated circuit technology; integrated memory circuits; large scale integration; redundancy; EPROM; Electrons; Equivalent circuits; Latches; Microprocessors; Nonvolatile memory; Random access memory; Timing; Tunneling;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1983.1051990