DocumentCode :
894756
Title :
A 20K-gate CMOS gate array
Author :
Saigo, Takashi ; Tago, Haruyuki ; Shiochi, Masazumi ; Hiwatashi, Tamotsu ; Niwa, Kiyoshi ; Shima, Shohei ; Moriya, Takahiko
Volume :
18
Issue :
5
fYear :
1983
Firstpage :
578
Lastpage :
584
Abstract :
Combining an advanced 2-/spl mu/m CMOS technology with a newly developed triple-level metallization technology, a high-performance 20K-gate CMOS gate array has been developed. The advantage of triple-level metallization for area saving in a large-scale gate array was evaluated by a computer simulation. The typical gate delay is 1.5 ns with fan-out of 3, and 3-mm metal interconnect length. As a test vehicle for verifying the high-performance gate array, a 32/spl times/32-bit parallel multiplier has been successfully designed and fabricated. Cell utilization is about 65%. A typical multiplication takes 120 ns at a 5-MHz clock rate, with a power dissipation of 400 mW.
Keywords :
Cellular arrays; Digital arithmetic; Digital simulation; Field effect integrated circuits; Integrated circuit technology; Integrated logic circuits; Large scale integration; cellular arrays; digital arithmetic; digital simulation; field effect integrated circuits; integrated circuit technology; integrated logic circuits; large scale integration; Application software; CMOS technology; Circuits; Delay; Electrons; Large scale integration; Large-scale systems; Metallization; Testing; Vehicles;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1983.1051997
Filename :
1051997
Link To Document :
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