• DocumentCode
    894756
  • Title

    A 20K-gate CMOS gate array

  • Author

    Saigo, Takashi ; Tago, Haruyuki ; Shiochi, Masazumi ; Hiwatashi, Tamotsu ; Niwa, Kiyoshi ; Shima, Shohei ; Moriya, Takahiko

  • Volume
    18
  • Issue
    5
  • fYear
    1983
  • Firstpage
    578
  • Lastpage
    584
  • Abstract
    Combining an advanced 2-/spl mu/m CMOS technology with a newly developed triple-level metallization technology, a high-performance 20K-gate CMOS gate array has been developed. The advantage of triple-level metallization for area saving in a large-scale gate array was evaluated by a computer simulation. The typical gate delay is 1.5 ns with fan-out of 3, and 3-mm metal interconnect length. As a test vehicle for verifying the high-performance gate array, a 32/spl times/32-bit parallel multiplier has been successfully designed and fabricated. Cell utilization is about 65%. A typical multiplication takes 120 ns at a 5-MHz clock rate, with a power dissipation of 400 mW.
  • Keywords
    Cellular arrays; Digital arithmetic; Digital simulation; Field effect integrated circuits; Integrated circuit technology; Integrated logic circuits; Large scale integration; cellular arrays; digital arithmetic; digital simulation; field effect integrated circuits; integrated circuit technology; integrated logic circuits; large scale integration; Application software; CMOS technology; Circuits; Delay; Electrons; Large scale integration; Large-scale systems; Metallization; Testing; Vehicles;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1983.1051997
  • Filename
    1051997