DocumentCode
894784
Title
Dual-Threshold CAD Framework for Subthreshold Leakage Power Aware FPGAs
Author
Kumar, Akhilesh ; Anis, Mohab
Author_Institution
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont.
Volume
26
Issue
1
fYear
2007
Firstpage
53
Lastpage
66
Abstract
Managing leakage power in field programmable gate arrays (FPGAs) has become critical for the FPGA industry to remain competitive in the semiconductor market and enter the mobile applications domain. This paper proposes and evaluates several dual-Vt-based designs of FPGA architecture for reducing the leakage power. A dual-Vt FPGA computer-aided design (CAD) framework has been proposed, which is used to develop and evaluate different dual-Vt FPGA architectures. The logic elements and the routing resources are considered as candidates for dual-Vt assignment. The authors estimate the number of the logic elements that can be assigned as high-Vt in the ideal case by using a dual-Vt assignment algorithm in the CAD framework. Based upon this estimate, the authors develop and evaluate two kinds of architectures, homogenous and heterogenous. The results indicate that an average leakage-power savings of up to 50% can be obtained from these architectures. This CAD framework can also be used for developing and evaluating different dual-Vt FPGA architectures other than the ones proposed in this paper
Keywords
delay estimation; electronic design automation; field programmable gate arrays; leakage currents; logic CAD; CMOS digital integrated circuits; FPGA architecture; computer-aided design framework; delay estimation; design automation; dual-threshold CAD framework; field programmable gate arrays; leakage currents; leakage-power savings; logic elements; mobile applications domain; semiconductor market; subthreshold leakage power aware; Algorithm design and analysis; Application software; CMOS technology; Design automation; Field programmable gate arrays; Logic; Routing; Subthreshold current; Very large scale integration; Voltage; CMOS digital integrated circuits; delay estimation; design automation; field programmable gate arrays (FPGAs); leakage currents;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2006.882595
Filename
4039498
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