DocumentCode :
894906
Title :
Thickness variation of breakdown field strength in plasma oxidized aluminum films
Author :
Nicol, W.S.
Volume :
56
Issue :
1
fYear :
1968
Firstpage :
109
Lastpage :
110
Abstract :
The breakdown field strength in plasma oxidized Al2O3films ranging in thickness from 15 to 600 Å, was observed to exhibit a dependence proportional to s-1/4, where s is oxide thickness. This variation was found to be temperature independent.
Keywords :
Aluminum oxide; Capacitance measurement; Dielectric thin films; Electric breakdown; Electrons; Glow discharges; Oxidation; Plasma measurements; Plasma temperature; Thickness measurement;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1968.6178
Filename :
1448108
Link To Document :
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