• DocumentCode
    894987
  • Title

    Modified KS, AD, and C-vM tests for the Pareto distribution with unknown location and scale parameters

  • Author

    Porter, James E., III ; Coleman, Joseph W. ; Moore, Albert H.

  • Author_Institution
    Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
  • Volume
    41
  • Issue
    1
  • fYear
    1992
  • fDate
    3/1/1992 12:00:00 AM
  • Firstpage
    112
  • Lastpage
    117
  • Abstract
    Standard goodness-of-fit tests based on the empirical CdF (Edf) require continuous underlying distributions with all parameters specified. Three modified Edf-type tests, the Kolmogorov-Smirnov (K-S), Anderson-Darling (A-D), and Cramer-von Mises (C-vM), are developed for the Pareto distribution with unknown parameters of location and scale and known shape parameter. The unknown parameters are estimated using best linear unbiased estimators. For each test, Monte Carlo techniques are used to generate critical values for sample sizes 5(5)30 and Pareto shape parameters 0.5(0.5)4.0. The powers of the modified tests are investigated under eight alterative distributions. In most cases, the powers of the modified K-S, A-D, C-vM tests are considerably higher than the chi-square test. Finally, a functional relationship is identified between the modified K-S and C-vM test statistics and the Pareto shape parameter. Powerful goodness-of-fit tests that supplement the best linear unbiased estimates are provided
  • Keywords
    failure analysis; reliability theory; statistical analysis; Anderson-Darling test; Cramer-von Mises test; Edf-type tests; Kolmogorov test; Monte Carlo techniques; Pareto distribution; empirical distribution function; goodness-of-fit tests; linear unbiased estimates; location parameters; reliability; scale parameters; shape parameter; test statistics; unknown parameters; Monte Carlo methods; Parameter estimation; Pareto analysis; Power generation economics; Reliability theory; Shape; State estimation; Statistical analysis; Statistical distributions; Testing;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.126681
  • Filename
    126681