Title :
Measurement of diffusion length and surface recombination velocity in semiconducting solids
Author :
Deb, Sujay ; Mukherjee, M.K. ; Dutta, Suparna
Abstract :
A two-dimensional diffusion theory taking surface recombination into account is utilized for measurement of the diffusion length L in semiconducting solids. Methods for simultaneous measurement of L and surface recombination velocity, and a scheme for further refinement in observation, are also indicated.
Keywords :
Charge carrier density; Length measurement; Probes; Pulse measurements; Radiative recombination; Semiconductivity; Solids; Strips; Velocity measurement; Voltage;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1968.6200
