Elimination of phase noise of pulsed laser diodes in electrooptic sampling systems

Author

Baur, G. ; Sölkner, G. ; Glöckle, W.G. ; Pfleiderer, H.J.

Author_Institution

Ulm Univ., Germany

Volume

29

Issue

4

fYear

1993

fDate

4/1/1993 12:00:00 AM

Firstpage

1022

Lastpage

1026

Abstract

The multimode operation of pulsed laser diode sources is converted into excess noise in electrooptic probing systems for electrical waveforms and prevents measurements with shot-noise-limited sensitivity. The transfer function of the sampling system is determined and analyzed in terms of the wavelength and electric field dependence. It is shown that by proper orientation of the polarizing components within the optical beam path, points of operation can by found which have both a vanishing wavelength dependence of the transfer function and maximum sensitivity to the electric fields to be measured. Excess noise sources due to wavelength fluctuations of the laser are thus eliminated, and shot-noise-limited voltage resolution is obtained. The system has been optimized to yield a voltage sensitivity of 2.3 mV/√Hz for a longitudinal LiNbO₃ probe crystal

Keywords

electro-optical devices; electron device noise; semiconductor lasers; electric field dependence; electrical waveforms; electrooptic probing systems; electrooptic sampling systems; excess noise; longitudinal LiNbO₃ probe crystal; multimode operation; optical beam path; phase noise; polarizing components; pulsed laser diode sources; shot-noise-limited voltage resolution; transfer function; voltage sensitivity; wavelength dependence; Diode lasers; Electric variables measurement; Noise measurement; Optical noise; Optical pulses; Phase noise; Pulse measurements; Transfer functions; Voltage; Wavelength measurement;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.214484

Filename

214484