• DocumentCode
    895374
  • Title

    HgTe Nanocrystal-Based Thin-Film Transistors Fabricated on Glass Substrates

  • Author

    Kim, Hyunsuk ; Kim, Dong-Won ; Cho, Kyoungah ; Kim, Sangsig

  • Author_Institution
    Dept. of Electr. Eng., Korea Univ., Seoul
  • Volume
    28
  • Issue
    1
  • fYear
    2007
  • Firstpage
    42
  • Lastpage
    44
  • Abstract
    HgTe nanocrystal-based thin-film transistors (TFTs) with Al2 O3 top-gate dielectrics were fabricated on glass substrates using sintered HgTe nanocrystals as the channel layers. To the best of our knowledge, this is the first report on the fabrication of nanocrystal-based TFTs on glass substrates. Colloidal HgTe nanocrystal films were first formed on the glass substrates by spin-coating. The HgTe nanocrystal films were then sintered at 150 degC, leading to a dramatic increase in their conductance, compared with the as-deposited films. The TFTs fabricated in this letter exhibit the typical characteristics of p-channel transistors with a field-effect mobility of 1.04 cm2/Vmiddots, a threshold voltage of +0.2 V, and an on/off current ratio of 1times103. These results suggest that spin-coating and sintering at a low temperature enable the simple and low-cost fabrication of nanocrystal-based TFTs on glass substrates
  • Keywords
    II-VI semiconductors; glass; mercury compounds; nanostructured materials; sapphire; sintering; spin coating; thin film transistors; 0.2 V; 150 C; HgTe; TFT; glass substrates; nanocrystal-based thin-film transistors; sintering; spin-coating; top-gate dielectric; Conductive films; Dielectric substrates; Fabrication; Glass; Inorganic materials; Nanocrystals; Organic materials; Plastics; Temperature; Thin film transistors; $hbox{Al}_{2}hbox{O}_{3}$; HgTe nanocrystal; solution process; thin-film transistor (TFT);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2006.888191
  • Filename
    4039555