DocumentCode :
895374
Title :
HgTe Nanocrystal-Based Thin-Film Transistors Fabricated on Glass Substrates
Author :
Kim, Hyunsuk ; Kim, Dong-Won ; Cho, Kyoungah ; Kim, Sangsig
Author_Institution :
Dept. of Electr. Eng., Korea Univ., Seoul
Volume :
28
Issue :
1
fYear :
2007
Firstpage :
42
Lastpage :
44
Abstract :
HgTe nanocrystal-based thin-film transistors (TFTs) with Al2 O3 top-gate dielectrics were fabricated on glass substrates using sintered HgTe nanocrystals as the channel layers. To the best of our knowledge, this is the first report on the fabrication of nanocrystal-based TFTs on glass substrates. Colloidal HgTe nanocrystal films were first formed on the glass substrates by spin-coating. The HgTe nanocrystal films were then sintered at 150 degC, leading to a dramatic increase in their conductance, compared with the as-deposited films. The TFTs fabricated in this letter exhibit the typical characteristics of p-channel transistors with a field-effect mobility of 1.04 cm2/Vmiddots, a threshold voltage of +0.2 V, and an on/off current ratio of 1times103. These results suggest that spin-coating and sintering at a low temperature enable the simple and low-cost fabrication of nanocrystal-based TFTs on glass substrates
Keywords :
II-VI semiconductors; glass; mercury compounds; nanostructured materials; sapphire; sintering; spin coating; thin film transistors; 0.2 V; 150 C; HgTe; TFT; glass substrates; nanocrystal-based thin-film transistors; sintering; spin-coating; top-gate dielectric; Conductive films; Dielectric substrates; Fabrication; Glass; Inorganic materials; Nanocrystals; Organic materials; Plastics; Temperature; Thin film transistors; $hbox{Al}_{2}hbox{O}_{3}$; HgTe nanocrystal; solution process; thin-film transistor (TFT);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2006.888191
Filename :
4039555
Link To Document :
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