DocumentCode
895420
Title
Cosmic Ray Induced Errors in I2L Microprocessors and Logic Devices
Author
Price, W.E. ; Pickel, J.C. ; Ellis, T. ; Frazee, F.B.
Author_Institution
Jet Propulsion Laboratory, Pasadena, California
Volume
28
Issue
6
fYear
1981
Firstpage
3945
Lastpage
3954
Abstract
Large scale integrated (LSI) devices fabricated with integrated injection logic (I2L) were studied by both heavy ion experiments asd device analysis to determine the upset threshold, the charge collection volumes and ultimately the probability for upset in the galactic cosmic ray spectrum. The devices studied, the SEP9900A, the SBP9989 and the P-Code generator were fabricated by Texas Instruments, Inc.
Keywords
Circuit testing; Cranes; Laboratories; Large scale integration; Logic devices; Microprocessors; Propulsion; Space technology; Switches; Weapons;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1981.4335653
Filename
4335653
Link To Document