• DocumentCode
    895461
  • Title

    Robust Coupled-Quantum-Well Structure for Use in Electrorefraction Modulators

  • Author

    Ristic, Sasa ; Jaeger, Nicolas A F

  • Author_Institution
    Dept. of Electr. & Comput. Eng., British Columbia Univ., Vancouver, BC
  • Volume
    28
  • Issue
    1
  • fYear
    2007
  • Firstpage
    30
  • Lastpage
    32
  • Abstract
    In this letter, an InGaAs/InAlAs coupled-quantum-well structure that is very robust to layer thickness and the compositional variations is reported. The robustness occurs because the structure´s electrorefraction (ER) is based on the anticrossing of the two lowest energy light-hole wave functions. The structure is, thus, more appropriate for use in transverse magnetic modulators rather than in transverse electric modulators. The robustness of the structure is shown to be superior to that of a similar structure that has its ER effect based on the anticrossing of the two lowest energy electron wave functions
  • Keywords
    III-V semiconductors; aluminium compounds; electromagnetic wave refraction; gallium arsenide; indium compounds; modulators; quantum wells; robust control; InGaAs-InAlAs; electrorefraction modulators; phase modulation; quantum-well modulator; robust coupled-quantum-well structure; transverse magnetic polarization modulation; Electrons; Erbium; Indium compounds; Indium gallium arsenide; Indium phosphide; Magnetic modulators; Phase modulation; Quantum wells; Robustness; Wave functions; Coupled quantum wells (CQWs); InAlAs; InGaAs; electrorefraction (ER); phase modulation; quantum-well modulator; transverse magnetic (TM) polarization modulation;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2006.887944
  • Filename
    4039563