DocumentCode :
895461
Title :
Robust Coupled-Quantum-Well Structure for Use in Electrorefraction Modulators
Author :
Ristic, Sasa ; Jaeger, Nicolas A F
Author_Institution :
Dept. of Electr. & Comput. Eng., British Columbia Univ., Vancouver, BC
Volume :
28
Issue :
1
fYear :
2007
Firstpage :
30
Lastpage :
32
Abstract :
In this letter, an InGaAs/InAlAs coupled-quantum-well structure that is very robust to layer thickness and the compositional variations is reported. The robustness occurs because the structure´s electrorefraction (ER) is based on the anticrossing of the two lowest energy light-hole wave functions. The structure is, thus, more appropriate for use in transverse magnetic modulators rather than in transverse electric modulators. The robustness of the structure is shown to be superior to that of a similar structure that has its ER effect based on the anticrossing of the two lowest energy electron wave functions
Keywords :
III-V semiconductors; aluminium compounds; electromagnetic wave refraction; gallium arsenide; indium compounds; modulators; quantum wells; robust control; InGaAs-InAlAs; electrorefraction modulators; phase modulation; quantum-well modulator; robust coupled-quantum-well structure; transverse magnetic polarization modulation; Electrons; Erbium; Indium compounds; Indium gallium arsenide; Indium phosphide; Magnetic modulators; Phase modulation; Quantum wells; Robustness; Wave functions; Coupled quantum wells (CQWs); InAlAs; InGaAs; electrorefraction (ER); phase modulation; quantum-well modulator; transverse magnetic (TM) polarization modulation;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2006.887944
Filename :
4039563
Link To Document :
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