DocumentCode
895461
Title
Robust Coupled-Quantum-Well Structure for Use in Electrorefraction Modulators
Author
Ristic, Sasa ; Jaeger, Nicolas A F
Author_Institution
Dept. of Electr. & Comput. Eng., British Columbia Univ., Vancouver, BC
Volume
28
Issue
1
fYear
2007
Firstpage
30
Lastpage
32
Abstract
In this letter, an InGaAs/InAlAs coupled-quantum-well structure that is very robust to layer thickness and the compositional variations is reported. The robustness occurs because the structure´s electrorefraction (ER) is based on the anticrossing of the two lowest energy light-hole wave functions. The structure is, thus, more appropriate for use in transverse magnetic modulators rather than in transverse electric modulators. The robustness of the structure is shown to be superior to that of a similar structure that has its ER effect based on the anticrossing of the two lowest energy electron wave functions
Keywords
III-V semiconductors; aluminium compounds; electromagnetic wave refraction; gallium arsenide; indium compounds; modulators; quantum wells; robust control; InGaAs-InAlAs; electrorefraction modulators; phase modulation; quantum-well modulator; robust coupled-quantum-well structure; transverse magnetic polarization modulation; Electrons; Erbium; Indium compounds; Indium gallium arsenide; Indium phosphide; Magnetic modulators; Phase modulation; Quantum wells; Robustness; Wave functions; Coupled quantum wells (CQWs); InAlAs; InGaAs; electrorefraction (ER); phase modulation; quantum-well modulator; transverse magnetic (TM) polarization modulation;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2006.887944
Filename
4039563
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