• DocumentCode
    895482
  • Title

    A simple model for the determination of I/sup 2/L base current components

  • Author

    Möllmer, Frank ; Müller, Rüdiger

  • Volume
    13
  • Issue
    6
  • fYear
    1978
  • Firstpage
    899
  • Lastpage
    905
  • Abstract
    Assuming uniform impurity and mobility profiles and a trapezoidal minority carrier distribution a simple structure-oriented model for an upward-operated I/SUP 2/L n-p-n transistor has been derived which accurately describes its DC properties. Its validity is demonstrated with reference to some examples. With the aid of this model it is now possible to determine the various base current components by measuring the collector current I/SUB c/ (V/SUB be/), the base current I/SUB b/(V/SUB be/), and the recollection current I/SUB rec/(V/SUB be/) directly at the I/SUP 2/L gate without the need of special test structures.
  • Keywords
    Bipolar integrated circuits; Integrated logic circuits; Semiconductor device models; bipolar integrated circuits; integrated logic circuits; semiconductor device models; Current measurement; Electrons; Epitaxial layers; Impurities; Integrated circuit modeling; Space charge; Space technology; Spontaneous emission; Testing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1978.1052066
  • Filename
    1052066