Title :
Transient Radiation Effects Evaluation of the F-8 Microprocessor
Author :
Coppage, F.N. ; Barnum, J.H. ; Collins, C. ; Corbett, W. ; Measel, P. ; Wahlin, K.
Author_Institution :
Sandia National Laboratories Albuquerque, New Mexico 87185
Keywords :
Central Processing Unit; Circuit testing; Linear particle accelerator; Logic devices; Microprocessors; Pulse circuits; Radiation detectors; Radiation effects; Registers; Space vector pulse width modulation;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1981.4335671
