DocumentCode
895608
Title
Transient Radiation Effects Evaluation of the F-8 Microprocessor
Author
Coppage, F.N. ; Barnum, J.H. ; Collins, C. ; Corbett, W. ; Measel, P. ; Wahlin, K.
Author_Institution
Sandia National Laboratories Albuquerque, New Mexico 87185
Volume
28
Issue
6
fYear
1981
Firstpage
4041
Lastpage
4045
Keywords
Central Processing Unit; Circuit testing; Linear particle accelerator; Logic devices; Microprocessors; Pulse circuits; Radiation detectors; Radiation effects; Registers; Space vector pulse width modulation;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1981.4335671
Filename
4335671
Link To Document