Title :
SEM Analysis of Ionizing Radiation Effects in an Analog to Digital Converter (AD571)
Author :
Gauthier, Michael K. ; Perret, Jonathan ; Evans, Kenneth C.
Author_Institution :
JET Propulsion Laboratory California Institute of Technology 4800 Oak Grove Drive Pasadena, California 91109
Keywords :
Analog-digital conversion; Circuits; Electron beams; Ionizing radiation; Laboratories; Propulsion; Radiation hardening; Scanning electron microscopy; Space technology; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1981.4335673
