Title :
Temperature dependence of permittivity and loss tangent of lithium tantalate at microwave frequencies
Author :
Jacob, Mohan V. ; Hartnett, John G. ; Mazierska, Janina ; Giordano, Vincent ; Krupka, Jerzy ; Tobar, Michael E.
Author_Institution :
Electr. & Comput. Eng. Dept., James Cook Univ., Townsville, Australia
Abstract :
Lithium tantalate (LiTaO3) exhibits excellent electro-optical, piezoelectric, and pyroelectric properties and a very low thermal expansion. In this paper, we report measurements of loss tangent and the real part of the relative permittivity εr⊥ measured in c-axis LiTaO3 crystals in the temperature range from 14 K to 295 K at a frequency of 11.4 and 10 GHz. Microwave properties of LiTaO3 were determined by measurements of the resonance frequency and the unloaded Qo factor of a TE011 mode cylindrical cavity containing the sample under test and accounting for uncalibrated cables and adaptors inside the cryocooler. The permittivity of LiTaO3 was found to increase from 38.9 to 41.1 and the loss tangent to change from 1.1×10-4 to 6.5×10-4 over the full temperature range. Due to its low loss and relatively high permittivity, LiTaO3 is suitable for microwave applications.
Keywords :
Q-factor; dielectric loss measurement; dielectric losses; dielectric resonance; lithium compounds; low-temperature techniques; microwave materials; permittivity; permittivity measurement; thermal expansion; 10 GHz; 11.4 GHz; 14 to 295 K; LiTaO3; TE011 mode cylindrical cavity; c-axis LiTaO3 crystals; cryocooler; dielectric materials; electro-optical properties; lithium tantalate; loss tangent; microwave applications; microwave frequencies; microwave properties; permittivity; piezoelectric properties; pyroelectric properties; relative permittivity; temperature dependence; temperature range; thermal expansion; uncalibrated adaptors; uncalibrated cables; unloaded Q factor; Crystals; Frequency measurement; Lithium compounds; Loss measurement; Microwave frequencies; Permittivity measurement; Pyroelectricity; Temperature dependence; Temperature distribution; Thermal expansion;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2003.821911