DocumentCode
895722
Title
Simulation of Radiation Damage in Solids
Author
Wood, Susan ; Doyle, N.J. ; Spitznagel, J.A. ; Choyke, W.J. ; More, R.M. ; McGruer, J.N. ; Irwin, R.B.
Author_Institution
Westinghouse R&D Center Pittsburgh, PA 15235
Volume
28
Issue
6
fYear
1981
Firstpage
4107
Lastpage
4112
Abstract
A combined theoretical and experimental study of primary recoil spectra effects or radiation damage in silicon is presented. Calculations determined how the damage energy is partitioned into free defects and cascades by fast collisions. The theory also showed that on a time scale ~10-14 sec. a very weak mass dependence of the lattice damage is to be expected. Channeling experiments were then performed on <111> single crystal silicon implanted with 1.0 MeV 20Ne, 0.5 MeV 4He and 75 keV 1H. Energies and fluences of the ions were matched such that over the first 0.3 ¿m the damage energy deposited and the rate of energy deposition were the same for all species. The experimental data were analyzed assuming that equivalent primary damage states will evolve into statistically equivalent final damage states at high fluences. They confirm that the final damage is essentially independent of the mass of the bombarding ion.
Keywords
Atomic beams; Atomic layer deposition; Atomic measurements; Backscatter; Energy measurement; Ion beams; Neutrons; Research and development; Silicon; Solid modeling;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1981.4335684
Filename
4335684
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