• DocumentCode
    895753
  • Title

    Robust and nonrobust path delay fault simulation by parallel processing of patterns

  • Author

    Fink, Franz ; Fuchs, Karl ; Schulz, Michael H.

  • Author_Institution
    Dept. of Electr. Eng., Tech. Univ. of Munich, Germany
  • Volume
    41
  • Issue
    12
  • fYear
    1992
  • fDate
    12/1/1992 12:00:00 AM
  • Firstpage
    1527
  • Lastpage
    1536
  • Abstract
    An accelerated fault simulation approach for path delay faults is presented. The distinct features of the proposed fault simulation method consist in the application of parallel processing of patterns at all stages of the calculation procedure, its versatility to account for both robust and nonrobust decision of path delay faults, and its capability of efficiently maintaining large numbers of path faults to be simulated
  • Keywords
    circuit analysis computing; fault location; integrated circuit testing; many-valued logics; parallel processing; parallel processing; path delay fault simulation; patterns; Acceleration; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Fault detection; Parallel processing; Propagation delay; Robustness; Timing;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.214661
  • Filename
    214661