DocumentCode
895753
Title
Robust and nonrobust path delay fault simulation by parallel processing of patterns
Author
Fink, Franz ; Fuchs, Karl ; Schulz, Michael H.
Author_Institution
Dept. of Electr. Eng., Tech. Univ. of Munich, Germany
Volume
41
Issue
12
fYear
1992
fDate
12/1/1992 12:00:00 AM
Firstpage
1527
Lastpage
1536
Abstract
An accelerated fault simulation approach for path delay faults is presented. The distinct features of the proposed fault simulation method consist in the application of parallel processing of patterns at all stages of the calculation procedure, its versatility to account for both robust and nonrobust decision of path delay faults, and its capability of efficiently maintaining large numbers of path faults to be simulated
Keywords
circuit analysis computing; fault location; integrated circuit testing; many-valued logics; parallel processing; parallel processing; path delay fault simulation; patterns; Acceleration; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Fault detection; Parallel processing; Propagation delay; Robustness; Timing;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.214661
Filename
214661
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