• DocumentCode
    895871
  • Title

    Stress-induced frequency shifts in rotated Y-cut langasite resonators with electrodes considered

  • Author

    Jing, Yun ; Chen, Jin ; Gong, Xun ; Duan, Jie

  • Author_Institution
    Rensselaer Polytech. Inst., Troy, NY
  • Volume
    54
  • Issue
    5
  • fYear
    2007
  • fDate
    5/1/2007 12:00:00 AM
  • Firstpage
    906
  • Lastpage
    909
  • Abstract
    Stress-induced frequency shifts of the thickness-shear vibration of rotated Y-cut langasite resonators are studied with the electrode considered. The relationship between mass loading and force-frequency coefficients is explored for several kinds of electrode materials. Comparisons between Y-cut langasite and AT-cut quartz resonators are also presented
  • Keywords
    crystal resonators; electrodes; gallium compounds; lanthanum compounds; vibrations; AT-cut quartz resonators; La3Ga5SiO14; electrodes; force-frequency coefficients; rotated Y-cut langasite resonators; stress-induced frequency shifts; thickness-shear vibration; Acoustic waves; Acoustical engineering; Aluminum; Azimuth; Capacitive sensors; Communication systems; Electrodes; Equations; Frequency; Surface acoustic wave devices;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2007.335
  • Filename
    4225301
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=895871