Title :
Stress-induced frequency shifts in rotated Y-cut langasite resonators with electrodes considered
Author :
Jing, Yun ; Chen, Jin ; Gong, Xun ; Duan, Jie
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY
fDate :
5/1/2007 12:00:00 AM
Abstract :
Stress-induced frequency shifts of the thickness-shear vibration of rotated Y-cut langasite resonators are studied with the electrode considered. The relationship between mass loading and force-frequency coefficients is explored for several kinds of electrode materials. Comparisons between Y-cut langasite and AT-cut quartz resonators are also presented
Keywords :
crystal resonators; electrodes; gallium compounds; lanthanum compounds; vibrations; AT-cut quartz resonators; La3Ga5SiO14; electrodes; force-frequency coefficients; rotated Y-cut langasite resonators; stress-induced frequency shifts; thickness-shear vibration; Acoustic waves; Acoustical engineering; Aluminum; Azimuth; Capacitive sensors; Communication systems; Electrodes; Equations; Frequency; Surface acoustic wave devices;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2007.335
