• DocumentCode
    895903
  • Title

    The effect of AM noise on correlation phase-noise measurements

  • Author

    Rubiola, Enrico ; Boudot, Rodolphe

  • Author_Institution
    Inst. of Franche-Comte Electron., Mecanique, Thermique et Optique Sci. et Technol., Univ. de Franche Comte, Besancon
  • Volume
    54
  • Issue
    5
  • fYear
    2007
  • fDate
    5/1/2007 12:00:00 AM
  • Firstpage
    926
  • Lastpage
    932
  • Abstract
    We analyze the phase-noise measurement methods in which correlation and averaging is used to reject the background noise of the instrument. All the known methods make use of a mixer, used either as a saturated-phase detector or as a linear-synchronous detector. Unfortunately, AM noise is taken in through the power-to-dc-offset conversion mechanism that results from the mixer asymmetry. The measurement of some mixers indicates that the unwanted amplitude-to-voltage gain is of the order of 5-50 mV, which is 12-35 dB lower than the phase-to-voltage gain of the mixer. In addition, the trick of setting the mixer at a sweet point - off the quadrature condition - where the sensitivity to AM nulls, works only with microwave mixers. The HF-VHF mixers do not have this sweet point. Moreover, we prove that if the AM noise comes from the oscillator under test, it cannot be rejected by correlation. At least not with the schemes currently used. An example shows that at some critical frequencies the unwanted effect of AM noise is of the same order - if not greater - than the phase noise. Thus, experimental mistakes are around the corner
  • Keywords
    correlation methods; microwave detectors; microwave mixers; phase noise; 12 to 35 dB; 5 to 50 mV; AM noise; amplitude-to-voltage gain; correlation phase-noise measurements; linear-synchronous detector; microwave mixers; phase-to-voltage gain; power-to-dc-offset conversion mechanism; saturated-phase detector; sweet point; Background noise; Detectors; Frequency; Gain measurement; Instruments; Microwave oscillators; Noise measurement; Phase measurement; Phase noise; Testing; Amplifiers; Artifacts; Equipment Failure; Equipment Failure Analysis; Radio Waves; Statistics as Topic; Ultrasonography;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2007.338
  • Filename
    4225304