DocumentCode
895930
Title
A 40 ns 64 kbit junction-shorting PROM
Author
Fukushima, Toshitaka ; Ueno, Kouji ; Matsuzaki, Yasurou ; Tanaka, Kazuo
Volume
19
Issue
2
fYear
1984
fDate
4/1/1984 12:00:00 AM
Firstpage
187
Lastpage
194
Abstract
The memory is organized as 8192 words/spl times/8 bits. A memory cell consists of a programmable element composed of a p-n junction diode and a vertically connected p-n-p transistor. During programming, the programmable element is changed from the current-blocking state of a reverse diode to the current-conducting state of a shorted junction diode by using the diffused eutectic aluminum process (DEAP). With a selective power switching dual-stage decoder, the power dissipation in the decoder circuit was reduced to 40% of a conventional decoder without power switching. The power saved was used to speed up the multiplexers and the output buffers.
Keywords
Bipolar integrated circuits; bipolar integrated circuits; Circuit synthesis; Conductivity; Decoding; Fabrication; Fuses; Multiplexing; P-n junctions; PROM; Schottky diodes; Switching circuits;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1984.1052116
Filename
1052116
Link To Document