Title :
Proposed Test Strategy for Radiation Hardened Custom LSI/VLSI
Author :
Spratt, J.P. ; Nickel, V.V. ; McCollum, G.L.
Author_Institution :
Questron Corporation El Segundo, CA
Keywords :
Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Integrated circuit testing; Large scale integration; Logic testing; Radiation hardening; System testing; Very large scale integration;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1981.4335712
