Title :
Properties of Microstrip Lines on Fused Quartz (Correspondence)
Author :
van Heuven, J.H.C. ; van Nie, A.G.
fDate :
2/1/1970 12:00:00 AM
Abstract :
The attenuation constant for microstrip lines on fused quartz and their effective relative dielectric constant were measured and the results are discussed. The propagation losses in these lines proved to be smaller than those mentioned in the literature. The effective relative dielectric constant is found to be independent of frequency up to 12 GHz. The conductors were deposited without an adhesive layer but with sufficient adhesion for pressure bonding semiconductor chips.
Keywords :
Attenuation; Conducting materials; Copper; Dielectric constant; Dielectric losses; Dielectric materials; Dielectric measurements; Dielectric substrates; Frequency; Microstrip;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1970.1127164
