Use of a Pinch Resistor for Neutron Hardness Assurance Screening of Bipolar Integrated Circuits

It is shown that a pinch resistor can be used to predict the neutron induced gain degradation of a related bipolar transistor. The experimental data indicate that the prediction accuracy can be at least as good as that obtained using the VBE(ON) measurement with a breakout transistor. Thus, the pinch resistor provides a simple DC test element which can be very effective in implementing a 100% electrical screening technique for the neutron hardness assurance of bipolar integrated circuits.