DocumentCode :
896241
Title :
Transient Effects of Ionizing Radiation in Photodiodes
Author :
Wiczer, J.J. ; Dawson, L.R. ; Barnes, C.E.
Author_Institution :
Sandia National Laboratories Albuquerque, New Mexico 87185
Volume :
28
Issue :
6
fYear :
1981
Firstpage :
4397
Lastpage :
4402
Abstract :
We report here on photodiode structures designed and fabricated to reduce the amplitude of unwanted, noise current induced during exposure to ionizing-radiation environments, without significantly reducing the desired photodiode signal current. For the optical wavelength range from .7 ¿m to 1.4 ¿m, we have studied three types of photodiode structures fabricated from AlGaAs, AlGaSb, and InGaAsP compound semiconductor materials. We also have tested and compared these specially fabricated, radiation insensitive photodiodes with commercially available photodiodes in an ionizing-radiation environment.
Keywords :
Ionizing radiation; Noise level; Noise reduction; Optical noise; Photodiodes; Semiconductor device noise; Semiconductor materials; Signal design; Testing; Working environment noise;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1981.4335737
Filename :
4335737
Link To Document :
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