DocumentCode :
896324
Title :
Bandgap narrowing and emitter efficiency in heavily doped emitter structures revisited
Author :
Van Vliet, Carolyne M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Florida Int. Univ., Miami, FL, USA
Volume :
40
Issue :
6
fYear :
1993
fDate :
6/1/1993 12:00:00 AM
Firstpage :
1140
Lastpage :
1147
Abstract :
The developments of heavy doping effects and of bandgap narrowing (BGN) concepts during the last two decades are critically discussed. The differences between the real bandgap reduction ΔEg and the apparent electrical bandgap reduction ΔG are once more set forth, showing the precise meaning of the density-of-states and degeneracy contributions to ΔG. From these concepts, the author indicated previously that for negligible recombination the minority-carrier emitter current (Jpe ) is given by a Mertens-type results. It is shown in this work that in the presence of surface and (or) bulk recombination (Auger and SRH) the result of C.R. Selvakumar and D.J. Roulston is recovered; however, the electrical field in the emitter and the effective intrinsic density of carriers are not those used by Selvakumar and Roulston (1987) but, on the contrary, these quantities are given by the detailed expressions of the author´s previous work (see A.H. Marshak and C.M. Van Vliet, 1984)
Keywords :
bipolar transistors; carrier density; electron-hole recombination; energy gap; heavily doped semiconductors; minority carriers; semiconductor device models; Mertens-type results; bandgap narrowing; bipolar transistor; bulk recombination; degeneracy contributions; density-of-states; effective intrinsic carrier density; electrical bandgap reduction; emitter efficiency; emitter electrical field; heavily doped emitter structures; minority-carrier emitter current; surface recombination; Bipolar transistors; Boltzmann equation; Charge carrier processes; Doping; Helium; Isothermal processes; Photonic band gap; Photovoltaic cells; Radiative recombination; Thermodynamics;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.214741
Filename :
214741
Link To Document :
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