• DocumentCode
    896494
  • Title

    Voltage Gradients in Solar Array Cavities as Possible Beeakdown Sites in Spacecraft-Charging-Induced Discharges

  • Author

    Stevens, N. John ; Mills, Hilton E. ; Orange, Lisa

  • Author_Institution
    National Aeronautics and Space Administration Lewis Research Center Cleveland, Ohio 44135
  • Volume
    28
  • Issue
    6
  • fYear
    1981
  • Firstpage
    4558
  • Lastpage
    4562
  • Abstract
    A possible explanation for environmentally-induced discharges on geosynchronous satellites exists in the electric fields formed in the cavities between solar cells - the small gaps formed by the cover slides, solar cells, metallic interconnects and insulating substrate. When exposed to a substorm environment, the cover slides become less negatively charged than the spacecraft ground. Hence, it is possible for metallic surfaces (usually silver mesh) to be at a negative potential in a cavity that has a "positive" surface above it. If the resultant electric field becomes large enough, then the interconnect could emit electrons (probably by field emission) which could be accelerated to space by the positive voltage on the covers. An experimental study was conducted using a small solar array segment in which the interconnect potential was controlled by a power supply while the cover slides were irradiated by monoenergetic electrons. It was found that discharges could be triggered when the interconnect potential became at least 500 volts negative with respect to the cover slides. Analytical modeling of satellites exposed to substorm environments indicates that such gradients are possible. Therefore, it appears that this trigger mechanism for discharges is possible. Details of the experiment and modeling study are presented.
  • Keywords
    Acceleration; Analytical models; Dielectrics and electrical insulation; Electron emission; Photovoltaic cells; Power supplies; Satellites; Silver; Space vehicles; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1981.4335764
  • Filename
    4335764