• DocumentCode
    896676
  • Title

    Design methodologies for high-performance noise-tolerant XOR-XNOR circuits

  • Author

    Goel, Sumeer ; Elgamel, Mohammed A. ; Bayoumi, Magdy A. ; Hanafy, Yasser

  • Author_Institution
    Center for Adv. Comput. Studies, Univ. of Louisiana, Lafayette, LA, USA
  • Volume
    53
  • Issue
    4
  • fYear
    2006
  • fDate
    4/1/2006 12:00:00 AM
  • Firstpage
    867
  • Lastpage
    878
  • Abstract
    Scaling down to deep submicrometer (DSM) technology has made noise a metric of equal importance as compared to power, speed, and area. Smaller feature size, lower supply voltage, and higher frequency are some of the characteristics for DSM circuits that make them more vulnerable to noise. New designs and circuit techniques are required in order to achieve robustness in presence of noise. Novel methodologies for designing energy-efficient noise-tolerant exclusive-OR-exclusive- NOR circuits that can operate at low-supply voltages with good signal integrity and driving capability are proposed. The circuits designed, after applying the proposed methodologies, are characterized and compared with previously published circuits for reliability, speed and energy efficiency. To test the driving capability of the proposed circuits, they are embedded in an existing 5-2 compressor design. The average noise threshold energy (ANTE) is used for quantifying the noise immunity of the proposed circuits. Simulation results show that, compared with the best available circuit in literature, the proposed circuits exhibit better noise-immunity, lower power-delay product (PDP) and good driving capability. All of the proposed circuits prove to be faster and successfully work at all ranges of supply voltage starting from 3.3 V down to 0.6 V. The savings in the PDP range from 94% to 21% for the given supply voltage range respectively and the average improvement in the ANTE is 2.67X.
  • Keywords
    integrated circuit noise; logic design; logic gates; 5-2 compressor design; arithmetic circuits; average noise threshold energy; deep submicrometer technology; exclusive-OR-exclusive-NOR circuits; noise immunity; noise-tolerant XOR-XNOR circuits; Adders; Circuit noise; Circuit simulation; Circuit testing; Design methodology; Energy efficiency; Frequency; Noise robustness; Signal design; Voltage; Arithmetic circuits; design methodology; exclusive-OR–exclusive-NOR (XOR–XNOR) circuits; noise tolerance;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2005.860119
  • Filename
    1618874