• DocumentCode
    896719
  • Title

    A 20 ns 64K (4Kx16) NMOS RAM

  • Author

    Schuster, Stanley E. ; Chappell, Barbara ; Lonardo, Victor Di ; Britton, Peter E.

  • Volume
    19
  • Issue
    5
  • fYear
    1984
  • Firstpage
    564
  • Lastpage
    571
  • Abstract
    A 64K (4K/spl times/16) NMOS RAM is described which uses new circuit techniques and design concepts to achieve an average nominal access time of 20 ns. The RAM was built using a relatively straightforward NMOS technology with single-level metal, single-level polycide, an average minimum feature size of 1.7 /spl mu/m, and an effective channel length of 1.2 /spl mu/m. The chip is organized physically into four 16K blocks. Cell area is 292 /spl mu/m/SUP 2/ with a chip area of 32.6 mm/SUP 2/. A four-device split-wordline cell was used to reduce the wordline delay. Chip organization, simplified clocking and timing, and new circuits were especially important for improved performance. An address buffer with internal reference, a switched decoupled bootstrapped decoder, and a self-timed sense amplifier are described.
  • Keywords
    Field effect integrated circuits; Integrated memory circuits; Random-access storage; field effect integrated circuits; integrated memory circuits; random-access storage; CMOS process; Capacitance; Circuits; Clocks; Impedance; MOS devices; Sampling methods; Synchronization; Timing;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1984.1052190
  • Filename
    1052190