DocumentCode :
897106
Title :
High frequency performance of GE high density interconnect modules
Author :
Haller, Theodore R. ; Whitmore, Barry S. ; Zabinski, Patrick J. ; Gilbert, Barry K.
Author_Institution :
General Electric Co., Schenectady, NY, USA
Volume :
16
Issue :
1
fYear :
1993
fDate :
2/1/1993 12:00:00 AM
Firstpage :
21
Lastpage :
27
Abstract :
The layout and routing of high-frequency multichip modules (MCMs) require a detailed electromagnetic characterization of the interconnect structure in order to manage required design trade-offs intelligently. To provide this characterization for the GE high-density-interconnect (HDI) process, a number of test coupons containing a variety of transmission line structures were prepared. S-parameter data were measured using a vector network analyzer (VNA), and these measured data were compared to the theoretical predictions based upon classical transmission line theory. Reasonable agreement is obtained provided that skin and proximity effects in the lines and ground planes are taken into account and that the nonrectangular natures of the conductor cross sections are accurately modeled. Results suggest that insertion loss rather than crosstalk is likely to be limiting for frequencies up to 9 GHz. For 20% (2-dB) attenuation, line lengths are 3-12 cm for the frequency range of 1-9 GHz
Keywords :
S-parameters; crosstalk; losses; multichip modules; transmission line theory; HDI modules; MCM; S-parameter data; VNA; crosstalk; electromagnetic characterization; high density interconnect; high-frequency multichip modules; insertion loss; test coupons; transmission line theory; vector network analyzer; Electromagnetic measurements; Frequency; Intelligent structures; Multichip modules; Routing; Scattering parameters; Skin; Testing; Transmission line measurements; Transmission line theory;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.214856
Filename :
214856
Link To Document :
بازگشت