Title :
A self-calibrating 15 bit CMOS A/D converter
Author :
Lee, Hae-Seung ; Hodges, David A. ; Gray, Paul R.
Abstract :
A self-calibrating analog-to-digital converter using binary weighted capacitors and resistor strings is described. Linearity errors are corrected by a simple digital algorithm. A folded cascode CMOS comparator resolves 30 /spl mu/V in 3 /spl mu/s. An experimental converter fabricated using a 6-/spl mu/m-gate CMOS process demonstrates 15-bit resolution and linearity at a 12-kHz sampling rate.
Keywords :
Analogue-digital conversion; CMOS integrated circuits; Comparators (circuits); Error correction; analogue-digital conversion; comparators (circuits); error correction; Analog-digital conversion; CMOS technology; Calibration; Error correction; Laboratories; Linearity; MOS capacitors; Resistors; Switched capacitor circuits; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1984.1052231
