Title :
Full-speed testing of A/D converters
Author :
Doernberg, Joey ; Lee, Hae-Seung ; Hodges, David A.
fDate :
12/1/1984 12:00:00 AM
Abstract :
Improved computer-aided analog-to-digital converter (ADC) characterization methods based on the code density test and spectral analysis using the fast Fourier transform are described. The code density test produces a histogram of the digital output codes of an ADC sampling a known input. The code density can be interpreted to compute the differential and integral nonlinearities, gain error, offset error, and internal noise. Conversion-rate and frequency-dependent behavior can also be measured.
Keywords :
Analogue-digital conversion; Automatic testing; Dynamic testing; Fast Fourier transforms; Integrated circuit testing; Spectral analysis; analogue-digital conversion; automatic testing; dynamic testing; fast Fourier transforms; integrated circuit testing; spectral analysis; Analog-digital conversion; Circuit testing; Computer errors; Fast Fourier transforms; Frequency conversion; Histograms; Laboratories; Linearity; Sampling methods; Semiconductor device noise;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1984.1052232