Title :
Analysis and improvement of photostore error rates
Author :
Chien, Robert T. ; Tang, Donald T. ; Barrekette, Euval S. ; Katcher, A.M.
Author_Institution :
University of Illinois, Urbana, Ill.
fDate :
5/1/1968 12:00:00 AM
Abstract :
Statistical experiments have been performed on the photostore to test its reliability as a mass storage system. Errors are analyzed with respect to rate, distribution and susceptibility to correction by several codes. The experimental results reported are based on disks recorded by optical techniques. Experimental results on disks recorded with electron beams will be reported separately.
Keywords :
Computational modeling; Error analysis; Optical buffering; Optical films; Optical recording; Performance evaluation; Redundancy; Reliability; Statistics; Ultraviolet sources;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1968.6410
