Title :
Guidelines governing the need for low-impedance drivers for MCM´s
Author :
Mi, Wei ; Brews, John R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
fDate :
2/1/1993 12:00:00 AM
Abstract :
High-speed, large-area integrated circuits (ICs) require packages with high-density, small cross-sectional interconnections. This trend toward more resistive interconnections is particularly clear for advanced thin-film multichip modules (MCMs). To obtain high clock speeds with these ICs and these packages requires a combined design of drivers, lines, and loads. By extending traditional impedance-matched design to a generalization that adjusts load, line, and driver for overshoot-controlled performance, maximum line lengths and driver impedances are found beyond which underdamped (i.e., rapid) response is not possible. These limits are provided for on-chip, MCM, and printed-circuit-board (PCB) interconnections. For line lengths typical of advanced thin-film MCM interconnections, an underdamped circuit response requires a driver with impedance significantly less than the characteristic impedance of a lossless interconnection line of the same geometry. As a result, drivers are required with impedances below the normal impedance-matched condition. Alternatively, wiring cross-sections can be increased with a corresponding decrease in wiring density or an increase in the number of wiring layers
Keywords :
driver circuits; electric impedance; impedance matching; multichip modules; thin film circuits; MCM; high-speed ICs; impedance-matched condition; large-area integrated circuits; low-impedance drivers; overshoot-controlled performance; packages; thin-film multichip modules; underdamped circuit response; wiring cross-sections; wiring density; wiring layers; Clocks; Driver circuits; Guidelines; High speed integrated circuits; Impedance; Integrated circuit interconnections; Integrated circuit packaging; Multichip modules; Thin film circuits; Wiring;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on