Measurement of AM Noise in Pulsed Oscillators and Amplifiers

The noise properties of amplifiers and oscillators are critical in systems applications. This paper describes a system for the measurement of AM noise in amplifiers and oscillators pulsed on for durations on the order of a microsecond or less. Such a system is useful in measuring AM noise in pulsed solid-state microwave devices such as avalanche- and Gunn-diode simplifiers and oscillators, where heat-dissipation limitations sometimes make continuous operation impossible.