• DocumentCode
    897663
  • Title

    An Advanced Bipolar-MOS-I/sub 2/L Technology with a Thin Epitaxial Layer for Analog-Digital VLSI

  • Author

    Okada, Yutaka ; Kaneko, Kenji ; Kudo, Satoshi ; Yamazaki, Kouichi ; Okabe, Takahiro

  • Volume
    20
  • Issue
    1
  • fYear
    1985
  • Firstpage
    152
  • Lastpage
    156
  • Abstract
    A novel Bi-MOS technology, Advanced Bipolar CMOS (ABC), is proposed. Bipolar transistors (n-p-n, p-n-p, I/sup 2/L)and MOS transistors (both n- and p-channel) have been successfully fabricated on the same chip with no decrease in performance by using a 3-/spl mu/m design rule. Thin epitaxial layer (<= 2 /spl mu/m) is used in order to obtain small-size high-performance (3-GHz) bipolar devices. Device size is reduced by using a shallow junction and self-aligning technique. n-channel MOS transistors are formed in p-well regions designed to reach p-type substrate, and p-channel MOS transistors are formed in epitaxial layer with an n/sup +/ buried layer. This technology has the potential for monolithic multifunctional analog-digital VLSI.
  • Keywords
    Integrated circuit technology; Integrated injection logic; VLSI; Analog circuits; Analog-digital conversion; Bipolar transistors; CMOS technology; Epitaxial layers; Integrated circuit technology; MOS devices; MOSFETs; Substrates; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1985.1052288
  • Filename
    1052288