Analysis of multilayer-multiconductor structures on anisotropic substrates using the finite difference method

Author

Jatkar, Deepak D. ; Beker, Benjamin

Author_Institution

Dept. of Electr. & Comput. Eng., South Carolina Univ., Columbia, SC, USA

Volume

18

Issue

3

fYear

1995

fDate

8/1/1995 12:00:00 AM

Firstpage

532

Lastpage

536

Abstract

In this paper, the finite difference method (FDM) is employed to study the effects of anisotropy on open, closed, or partially shielded multilayer-multiconductor structures. Effects of tilting the optical axis of the substrate with respect to the axes of the structure are investigated. The method was found to be suitable for the analysis of circuit geometries appearing in microwave integrated circuits (MIC´s), printed circuit boards (PCB´s) and in surface acoustic wave (SAW) applications for frequencies up to 5, and in some cases, to 10 GHz

Keywords

crosstalk; electromagnetic shielding; finite difference methods; integrated circuit packaging; microwave integrated circuits; printed circuit layout; surface acoustic wave devices; 0 to 10 GHz; SAW applications; anisotropic substrates; circuit geometries; closed structures; finite difference method; microwave integrated circuits; multilayer-multiconductor structures; open structures; optical axis tilting; partially shielded structures; printed circuit boards; Anisotropic magnetoresistance; Application specific integrated circuits; Circuit analysis; Finite difference methods; Geometrical optics; Microwave integrated circuits; Microwave theory and techniques; Optical surface waves; Printed circuits; Surface acoustic waves;

fLanguage

English

Journal_Title

Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on

Publisher

ieee

ISSN

1070-9894

Type

jour

DOI

10.1109/96.404112

Filename

404112