DocumentCode :
898122
Title :
An isolated vertical n-p-n transistor in an n-well CMOS process
Author :
Zeitzoff, Peter M. ; Anagnostopoulos, Constantine N. ; Wong, Kwok Y. ; Brandt, Brian P.
Volume :
20
Issue :
2
fYear :
1985
fDate :
4/1/1985 12:00:00 AM
Firstpage :
489
Lastpage :
494
Abstract :
Isolated vertical n-p-n transistors were fabricated by a modified 5-/spl mu/m n-well CMOS process. The modification included a decrease in the p/SUP +/ source and drain implant dose and an increase in the final anneal time, but no extra processing steps of masks were required. The n-p-n transistors had generally good characteristics, with H/SUB FE//spl ap/600 and BV/SUB CEO//spl ap/40 V, while the MOS characteristics were unchanged.
Keywords :
CMOS integrated circuits; Integrated circuit technology; integrated circuit technology; Annealing; Bipolar transistors; Boron; CMOS process; Driver circuits; Electrical resistance measurement; Implants; MOS devices; MOSFETs; Transconductance;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.1985.1052334
Filename :
1052334
Link To Document :
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