DocumentCode :
898127
Title :
Static and dynamic behavior of paralleled IGBTs
Author :
Letor, Romeo
Author_Institution :
SGS-Thomson Microelectron., Catania, Italy
Volume :
28
Issue :
2
fYear :
1992
Firstpage :
395
Lastpage :
402
Abstract :
Problems associated with power device characteristics when power devices are connected in parallel, such as thermal stability and balanced switching behavior, can be solved by using insulated gate bipolar transistors (IGBTs). The author deals with parallel IGBT behaviors analyzing both static and dynamic characteristics. The influence of heatsink mounting, layout, and drive circuit are described in order to demonstrate the best way to make IGBTs parallel for optimum performance. In addition, the major advantages of the ISOTOP package are shown
Keywords :
driver circuits; heat sinks; insulated gate bipolar transistors; switching; thermal analysis; ISOTOP package; balanced switching behavior; drive circuit; dynamic behavior; heatsink mounting; insulated gate bipolar transistors; parallel IGBT; static behaviour; thermal stability; Circuit stability; Current density; Extrapolation; Industry Applications Society; Insulated gate bipolar transistors; Packaging; Power dissipation; Switching loss; Temperature; Thermal stability;
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/28.126748
Filename :
126748
Link To Document :
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